Microtek International, Inc.
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Microtek International, Inc.

Fabric Defect Inspection

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Fabric Defect Inspection

Fabric Defect Inspection

Product Parameters

Product Name Fabric Defect Inspection
Item No. 10-2-3, AI Automated Fabric Inspection Solution
Supply Type Sell
Category Industrial Supplies Hardware > Meter,Instrument > Measuring Instrument

Detailed Product Description

AI Automated Fabric Inspection Solution

Fabric defects discovered after weaving often lead to rework, downgraded shipments, or scrap. Microtek’s AI Automated Fabric Inspection Solution is designed for post-process fabric inspection, enabling fast and consistent defect detection during fabric inspection, length measurement, and roll inspection.
Powered by AI image analysis, it reduces reliance on manual visual checks, ensuring standardized, repeatable, and reliable quality decisions.

Key Advantages:
  • Optimized Hardware Integration
    Flexible imaging deployment compatible with various fabric inspection machines, capturing stable images without disrupting inspection operations.
  • AI-Assisted Inspection
    Real-time defect detection minimizes missed defects and misjudgments of human errors.
  • Instant Defect Localization
    Defects are automatically detected and marked to accelerate grading, cutting, and downstream processing.
  • Configurable Inspection Strategy.
    Customizable defect types and inspection thresholds balance detection accuracy and false alarms.
  • Digitized Quality Monitoring
    Dashboards and defect analytics transform inspection results into traceable data, supporting data-driven management decisions.
By integrating optical imaging, precision mechanical design, and AI image processing, this solution delivers fast and accurate quality control—from system deployment to data analysis. It does not replace fabric inspection machines—it makes them smarter, more consistent, and more efficient.
For more information or to customized inspection requirements, please feel free to contact us

Features
  • Real-time 100% inspection for full visibility of finished fabric quality
  • Non-contact, high-precision imaging without disrupting roll inspection
  • Broad compatibility with fabric inspection machines for fast, no-intrusive deployment
  • Instant AI defect detection and marking to improve inspection accuracy and efficiency
  • Centralized monitoring of multiple machines for real-time inspection status
  • Open API support for easy integration with existing enterprise systems
Textile Inspection Brochure

Technical Architecture
Front-end Imaging:Line Scan CCD Camera
Edge AI Inference:High-speed Edge Computing PC
Back-end Monitoring:Remote Analysis & Management System

Keywords: AOI Inspection  Textile Defect Inspection   

Enquire Now!
Company Name Microtek International, Inc.
Country/Region Taiwan
City Hsinchu City 30075
Address No. 6, Industry East Road 3, Science Based Industrial Park
Telephone +886-3-5772155
Fax +886-3-5772598
Contact Person
Website www.bestimagescanner.com