Microtek International, Inc.
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Microtek International, Inc.

Defect Inspection System

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Defect Inspection System

Defect Inspection System

Product Parameters

Product Name Defect Inspection System
Item No. 10-4,FAI-630
Supply Type Sell
Category Industrial Supplies Hardware > Electrical Equipment > AOI Inspection

Detailed Product Description

Scanning and Inspecting Module

Introduction
FAI-630 is a non-contact color linear image capturing module, which is suitable for using together with various conveyors in order to capture large-scale images precisely. With the resolution is up to 20 μm, the scanning area is up to 12 x 24 inches and the working distance is up to 2.5 cm, FAI-630 works best for FAI or identifying, comparing and inspecting images of PWBA before pasting solder. The working distance of the FAI-630 can be customized according to customers’ demands.

Features
  • Non-contact image capturing technology ensures the completeness of scanned targets
  • Using together with different angles of lights to capture images of scanned targets presents characteristics of different materials clearly
AOI Brochure

Specifications
Scanning Area: 12” x 24”
Working Distance: 2.5 cm
Scanning Resolution: 20 μm
Image Sensor Type: Color linear CCD

Keywords: AOI Inspection  Defect Inspection System   

Enquire Now!
Company Name Microtek International, Inc.
Country/Region Taiwan
City Hsinchu City 30075
Address No. 6, Industry East Road 3, Science Based Industrial Park
Telephone +886-3-5772155
Fax +886-3-5772598
Contact Person
Website www.bestimagescanner.com